Time: 9:30-10:30am，march30th,2012(Friday)

Place:446 Room, ICT, CAS

Speaker:Dr. Yu Huang

Abstract:
FastScan and TestKompress support all standard fault models such as stuck-at, transition, IDDQ, bridge, and path delay. These fault models are typically sufficient to create a highly efficient pattern set that detects the majority of potential defects. However, a number of defects are not covered by these models and are detected only by accident. These defects require specific conditions that cannot be defined for the existing fault models.

You can now use the user-defined fault model (UDFM) feature to define custom fault models. These custom models enable you to generate specific test patterns for process-related defects like intra-cell bridges or any other kind of defect that requires additional constraints.

bio:
Yu Huang received his Ph.D. degree in Electrical and Computer Engineering from the University of Iowa, USA. Dr. Huang is currently working as a Senior Member of Staff in the Advance Research Group within the Silicon Test Solutions Division at Mentor Graphics. He has published about 85 technical papers in leading IEEE journals, international conferences and workshops. He has 7 US or international patents approved and 8 more patents pending. He was invited as program committee member or panelist in several conferences such as ITC, VTS, ATS, ETS, ASPDAC, SEMICON, VALID, NATW and WRTLT. He was the visiting professor at Tsinghua University, July to October 2010.