Dr. Li has been a Professor with the Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China, since 2008. She was a visiting Professor at the University of California at Santa Barbara, from 2009 to 2010. Her current research interests include testing of VLSI/SOC circuits, design verification, approximate computing, and design of deep learning processors. She was a recipient of the 2012 National Technology Invention Award of China. She received the Best Paper Award of 2021 IEEE Transactions on Computers, and the Best Paper Awards in 2019 IEEE International Conference on Computer Design (ICCD), and in 2018 IEEE International Test Conference in Asia (ITC-Asia). She currently serves as the Secretary General of the China Computer Federation (CCF) Technical Committee on Integrated Circuit Design, and serves as the Associate Editor for IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Design & Test., and Journal of Computer Science & Technology (JCST). She served as the Steering Committee Chair for IEEE Asian Test Symposium (2020-2022), the Steering Committee Chair for IEEE Workshop on RTL and High Level Testing (2014-2016), the Secretary General (2008–2015) and the Chair (2016–2019) for the CCF Technical Committee on Fault Tolerant Computing, and served in the Technical Program Committees for several IEEE conferences including DAC, ICCAD, DATE, ASP-DAC, ITC, VTS, etc. She is a Fellow of CCF.